Title :
Measuration of Nanometer Grain Content for Complex Material by Spectrophotometric Method
Author :
Wang, Dianlong ; Dai, Changsong ; Yi, Tingfeng ; Zhang, Yong ; Zhang, Changsheng ; Sun, Dezhi
Abstract :
The relation of direct proportion between absorbance and nanometer grain content is educed by analysing the extinction law which the monochromatic light passes turbid solution of nanometer grain. The feasibility mensurating nanometer grain content for complex material by spectrophotometric method is verified according to the composite deposit of Ni-P/alpha-Al2O3 (30nm). The results show that the standard curve of relation between the concentration of turbid solution of nanometer grain and absorbance is a straight line, and the linear correlative degree of the data reaches 99.96%. The measuring condition which the incident light wave is 500nm, and the concentration range of alpha-Al2O3 is 8-40mgmiddotL-1 is determined; moreover, the effect of ultrasonic wave dispersion on absorbency of nanometer particle is also studied. So it offers a better method to mensurate nanometer grain content for complex material
Keywords :
aluminium compounds; composite materials; grain size; nanostructured materials; nickel compounds; optical properties; phosphorus compounds; spectrophotometry; turbidity; ultrasonic waves; 30 nm; 500 nm; Al2O3; Ni-P; extinction law; mensuration; monochromatic light; nanometer grain content; spectrophotometric method; turbid solution; ultrasonic wave dispersion; Chemical technology; Composite materials; Light scattering; Materials science and technology; Mie scattering; Nanostructured materials; Particle measurements; Particle scattering; Rayleigh scattering; Ultrasonic variables measurement; absorbance; complex material; nanometer grain;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
DOI :
10.1109/NEMS.2006.334768
