Constructive multi-phase test point insertion for scan-based BIST

This paper presents a novel test point insertion technique which, unlike the previous ones, is based on a constructive methodology. A divide and conquer approach is used to partition the entire test into multiple phases. In each phase a group of test points targeting a specific set of faults is selected. Control points within a particular phase are enabled by fixed values, resulting in a simple and natural sharing of the logic driving them. Experimental results demonstrate that complete or near-complete stuck-at fault coverage can be achieved by the proposed technique with the insertion of a few test points and a minimum number of phases