Title :
On the mechanism of recovery voltage in a dielectric solid proposal of a simple equation
Author :
Yamaguchi, A. ; Hirai, N. ; Ohki, Y.
Author_Institution :
Dept. of Electr., Electron., & Comput. Eng., Waseda Univ., Tokyo, Japan
Abstract :
The environmental conditions under which dielectric materials are used have become more and more serious with the progress of science, and demands for a higher reliability and a higher stability of dielectric materials have become even stronger. Therefore, a proper method to diagnose the condition of dielectric materials is required. Recently, diagnosis of degradation of power cables or transformer bushings by recovery voltage measurement and the theoretical background of recovery voltage have been discussed. In this paper, we propose a simple equation of recovery voltage based on an equivalent circuit and a theoretical equation that we proposed in our previous paper and show the validity of this simple equation by comparing experimental data with theoretical curves. The capacitance and the resistance associated with traps in the dielectric solid are also estimated
Keywords :
equivalent circuits; insulation testing; organic insulating materials; permittivity; power cable insulation; power transformer insulation; capacitance; dielectric solid; environmental conditions; equivalent circuit; power cables; power transformer bushings; recovery voltage; reliability; resistance; stability; traps; Degradation; Dielectric materials; Equations; Insulators; Materials reliability; Power cables; Proposals; Solids; Stability; Voltage;
Conference_Titel :
Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
Conference_Location :
Himeji
Print_ISBN :
4-88686-053-2
DOI :
10.1109/ISEIM.2001.973564