Title :
Towards a Global Business Document Reference Ontology
Author :
Liegl, Philipp ; Huemer, Christian ; Zapletal, Marco
Author_Institution :
Vienna Univ. of Technol., Vienna, Austria
Abstract :
In the field of business document standardization a multitude of different standardization efforts exist. Unfortunately, most of the developed standards are designed for a specific application domain or industry and do not consider cross-standard interoperability. This results in several incompatible standard definitions. Without the provision of a common semantical basis for business document definitions, cross-domain interoperability cannot be achieved. In this paper we provide a methodology for building a global reference ontology based on the core components technical specification (CCTS) and Web Ontology Language (OWL). Using our approach a common semantic business document basis is developed. New document definitions may be derived from this basis and existing document definitions may be aligned to it. Using our ´derivation-by-restriction´ mechanism, instances derived from a common semantical basis are interoperable to each other. Thus, mapping mechanisms between different standard definitions may be implemented in an easier and semantically correct manner.
Keywords :
business data processing; document handling; knowledge representation languages; ontologies (artificial intelligence); open systems; Web Ontology Language; business document reference ontology; business document standardization; core components technical specification; derivation-by-restriction mechanism; document definition; global reference ontology; interoperability; semantic business document; Artificial intelligence; Asia; Humans; Logic; Ontologies; Pervasive computing; Production systems; Robustness; Semantic Web; Uncertainty; OWL; UN/CEFACT´s Core Components Technical Specification; business document ontology; business information entity; core component; ontology mapping; reference onology;
Conference_Titel :
Semantic Computing, 2009. ICSC '09. IEEE International Conference on
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4244-4962-0
Electronic_ISBN :
978-0-7695-3800-6
DOI :
10.1109/ICSC.2009.24