DocumentCode :
2054295
Title :
A Quality Perspective of Software Evolvability Using Semantic Analysis
Author :
Schugerl, Philipp ; Rilling, Juergen ; Witte, René ; Charland, Philippe
Author_Institution :
Dept. of Comput. Sci. & Software Eng., Concordia Univ., Montreal, QC, Canada
fYear :
2009
fDate :
14-16 Sept. 2009
Firstpage :
420
Lastpage :
427
Abstract :
Software development and maintenance are highly distributed processes that involve a multitude of supporting tools and resources. Knowledge relevant to these resources is typically dispersed over a wide range of artifacts, representation formats, and abstraction levels. In order to stay competitive, organizations are often required to assess and provide evidence that their software meets the expected requirements. In our research, we focus on assessing non-functional quality requirements, specifically evolvability, through semantic modeling of relevant software artifacts. We introduce our SE-Advisor that supports the integration of knowledge resources typically found in software ecosystems by providing a unified ontological representation. We further illustrate how our SE-Advisor takes advantage of this unified representation to support the analysis and assessment of different types of quality attributes related to the evolvability of software ecosystems.
Keywords :
distributed processing; ontologies (artificial intelligence); software maintenance; software quality; SE-Advisor; distributed processes; knowledge resources integration; nonfunctional quality requirements; semantic analysis; semantic software engineering environment; software artifacts; software development; software ecosystems; software evolvability; software maintenance; unified ontological representation; Computer science; Distributed computing; Ecosystems; Ontologies; Programming; Software engineering; Software maintenance; Software quality; Software systems; Software tools; Ontology; software evolvability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semantic Computing, 2009. ICSC '09. IEEE International Conference on
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4244-4962-0
Electronic_ISBN :
978-0-7695-3800-6
Type :
conf
DOI :
10.1109/ICSC.2009.10
Filename :
5298653
Link To Document :
بازگشت