DocumentCode :
2054388
Title :
A Virtual Tapping-Mode Atomic Force Microscope
Author :
Zhou, Xianwei ; Fang, Yongchun
Author_Institution :
Inst. of Robotics & Inf. Autom. Syst., Nankai Univ., Tianjin
fYear :
2006
fDate :
18-21 Jan. 2006
Firstpage :
501
Lastpage :
504
Abstract :
Tapping-mode atomic force microscope (TM-AFM) is currently the most widely utilized instrument for atomic-resolution imaging and nano-manipulation. However, the complex cantilever-tip dynamics has not been fully understood due to the inherent nonlinear property of tip-sample interaction. Experiments and analytical techniques are two basic methods to investigate the nonlinear effects, but they are either too costly or requires extremely advanced mathematical and physical knowledge to apply. In this paper, we present an alternative solution for this problem by constructing a virtual tapping-mode AFM system built in Matlab-Simulink environment. As demonstrated in the paper, the virtual AFM is capable of performing various classic experiments in AFM including approach-retract, sweeping frequency, PID-based amplitude regulation etc. It also provides a numerical platform for research work to explore new ambitious control strategies aiming at improving the scanning speed and precision of the AFM system
Keywords :
atomic force microscopy; physics computing; AFM system control strategies; AFM system precision; AFM system scanning speed; Matlab-Simulink; PID-based amplitude regulation AFM experiment; TM-AFM; approach-retract AFM experiment; atomic force microscope; atomic resolution imaging; cantilever-tip dynamics; nanomanipulation; nonlinear tip-sample interaction; sweeping frequency AFM experiment; virtual AFM; virtual tapping mode AFM; Atomic force microscopy; Computer languages; Control systems; Damping; Frequency; Information analysis; Mathematical model; Nonlinear dynamical systems; Nonlinear equations; Systems engineering and theory; amplitude modulation; atomic force microscope; tapping mode;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
Type :
conf
DOI :
10.1109/NEMS.2006.334827
Filename :
4135004
Link To Document :
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