Title :
An application of photoconductive switch for high-speed testing
Author :
Chihara, Kazunori ; Sekino, Takashi ; Sasaki, Koji
Author_Institution :
Advantest Labs. Ltd., USA
Abstract :
This paper describes a high speed test technique for CMOS device with I/O terminals using photoconductive switch (PC-switch). Since the switching speed of the PC-switch is high, it can be utilized by fast test systems. The PC-switch uses indium phosphide (InP), and has an on-resistance 40-60 Ω, a switching time of 1 ns, a capacitance between terminals of 31 fF, and a break down voltage 9.5 V. The PC-switch can be used with a laser diode (LD) to implement an optical driven line switch (ODLS). The performance of ODLS is suitable for testing devices with high speed I/O pins. The ROUND TRIP DELAY of less than 500 ps is achievable by assembling the I/O switch on a performance board in close proximity to the device pin. The I/O switching characteristics of this PC-switch have been verified by simulation and experimentation
Keywords :
CMOS integrated circuits; III-V semiconductors; automatic testing; indium compounds; integrated circuit testing; photoconducting switches; 1 ns; 31 fF; 40 to 60 ohm; 9.5 V; CMOS device; I/O switching characteristics; I/O terminals; III-V semiconductors; InP; break down voltage; high-speed testing; optical driven line switch; photoconductive switch; switching speed; switching time; CMOS technology; Capacitance; Diode lasers; High speed optical techniques; Indium phosphide; Optical switches; Photoconducting devices; Photoconductivity; System testing; Voltage;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557124
