DocumentCode
2054848
Title
Substrate temperature dependence of feature profile of carbon films on substrate with submicron trenches
Author
Nomura, Takuya ; Urakawa, Tatsuya ; Korenaga, Yuki ; Yamashita, Daisuke ; Matsuzaki, Hidefumi ; Koga, Kazunori ; Shiratani, Masaharu ; Setsuhara, Yuichi ; Sekine, Makoto ; Hori, Masaru
Author_Institution
Grad. Sch. of Inf. Sci. & Electr. Eng., Kyushu Univ., Fukuoka, Japan
fYear
2010
fDate
21-24 Nov. 2010
Firstpage
2213
Lastpage
2215
Abstract
To control deposition profile of carbon films in trenches, we have studied substrate temperature dependence of deposition rate of carbon films and we have realized anisotropic deposition of carbon films in trenches above 250° deposited by CVD plasma of toluene diluted H2, in trenches. Here, we report dependence of properties of plasma CVD carbon films on substrate temperature.
Keywords
carbon; plasma CVD; thin films; C; CVD plasma deposition; anisotropic deposition; carbon films; substrate temperature; Raman spectroscopy; anisotropic deposition; carbon film; deposition profile; plasma CVD;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2010 - 2010 IEEE Region 10 Conference
Conference_Location
Fukuoka
ISSN
pending
Print_ISBN
978-1-4244-6889-8
Type
conf
DOI
10.1109/TENCON.2010.5686688
Filename
5686688
Link To Document