DocumentCode
2055472
Title
High-Aspect Ratio Metallic Nano Grippers
Author
Jeongsoo Lee ; Park, Daniel S. ; Nallani, Arun K. ; Yonghao Cur ; Skoyles, Aidan ; Lee, Jeongsoo
Author_Institution
Erik Johnson Sch. of Eng. & Comput. Sci., Univ. of Texas at Dallas, Richardson, TX
fYear
2006
fDate
18-21 Jan. 2006
Firstpage
682
Lastpage
686
Abstract
We report the fabrication and characterization of a submicron metallic electrothermal gripper using a combination of electron beam (e-beam) lithography and electroplating techniques. An SU-8 layer was used as a sacrificial layer and polymethyl methacrylate (PMMA) resist was patterned using e-beam lithography to create ~3:1 aspect ratio (1 mum thick, 350 nm critical feature width) mold for electroplating. Nickel was electroplated and resist layers were removed to make the device suspended. The submicron gripper was characterized using a nanomanipulator installed in a dual-beam focused ion beam system. The jaw closing up to 1.39 mum with an applied current of 28 mA has been reproducibly observed, which is corresponding to the maximum power consumption of 11.2 mW. Finite element analysis (FEA) using ANSYS was performed and the FEA results showed a good agreement with the measured results.
Keywords
electron beam lithography; electroplating; finite element analysis; grippers; micromanipulators; electron beam lithography; electroplating; fabrication; finite element analysis; metallic nanogrippers; nanomanipulator; polymethyl methacrylate resist; submicron metallic electrothermal gripper; Electron beams; Electrothermal effects; Energy consumption; Fabrication; Finite element methods; Grippers; Ion beams; Lithography; Nickel; Resists;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location
Zhuhai
Print_ISBN
1-4244-0139-9
Electronic_ISBN
1-4244-0140-2
Type
conf
DOI
10.1109/NEMS.2006.334872
Filename
4135045
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