• DocumentCode
    2055472
  • Title

    High-Aspect Ratio Metallic Nano Grippers

  • Author

    Jeongsoo Lee ; Park, Daniel S. ; Nallani, Arun K. ; Yonghao Cur ; Skoyles, Aidan ; Lee, Jeongsoo

  • Author_Institution
    Erik Johnson Sch. of Eng. & Comput. Sci., Univ. of Texas at Dallas, Richardson, TX
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    682
  • Lastpage
    686
  • Abstract
    We report the fabrication and characterization of a submicron metallic electrothermal gripper using a combination of electron beam (e-beam) lithography and electroplating techniques. An SU-8 layer was used as a sacrificial layer and polymethyl methacrylate (PMMA) resist was patterned using e-beam lithography to create ~3:1 aspect ratio (1 mum thick, 350 nm critical feature width) mold for electroplating. Nickel was electroplated and resist layers were removed to make the device suspended. The submicron gripper was characterized using a nanomanipulator installed in a dual-beam focused ion beam system. The jaw closing up to 1.39 mum with an applied current of 28 mA has been reproducibly observed, which is corresponding to the maximum power consumption of 11.2 mW. Finite element analysis (FEA) using ANSYS was performed and the FEA results showed a good agreement with the measured results.
  • Keywords
    electron beam lithography; electroplating; finite element analysis; grippers; micromanipulators; electron beam lithography; electroplating; fabrication; finite element analysis; metallic nanogrippers; nanomanipulator; polymethyl methacrylate resist; submicron metallic electrothermal gripper; Electron beams; Electrothermal effects; Energy consumption; Fabrication; Finite element methods; Grippers; Ion beams; Lithography; Nickel; Resists;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334872
  • Filename
    4135045