Title :
The P1149.4 Mixed Signal Test Bus: costs and benefits
Author_Institution :
Telecom Microelectron. Centre, Northern Telecom Electron. Ltd., Ottawa, Ont., Canada
Abstract :
This paper summarizes key elements of the proposed IEEE P1149.4 Mixed-Signal Test Bus Standard, examines costs and benefits in detail, and includes specific circuit examples. The significant costs are silicon area and pins. Benefits include test cost reduction, diagnosability, and unique capabilities. Changes proposed since ITC´93 and areas of controversy are noted for this un-released standard
Keywords :
IEEE standards; automatic test equipment; automatic testing; built-in self test; computer interfaces; costing; integrated circuit testing; mixed analogue-digital integrated circuits; peripheral interfaces; BIST; IEEE P1149.4 Mixed-Signal Test Bus Standard; analog bus pins; costs; data register; diagnosability; parametric measurements; silicon area; test cost reduction; Analog integrated circuits; Circuit testing; Costs; Digital integrated circuits; Integrated circuit testing; Pins; Signal design; Silicon; Telecommunications; Voltage;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529871
