DocumentCode
2055615
Title
The P1149.4 Mixed Signal Test Bus: costs and benefits
Author
Sunter, Stephen
Author_Institution
Telecom Microelectron. Centre, Northern Telecom Electron. Ltd., Ottawa, Ont., Canada
fYear
1995
fDate
21-25 Oct 1995
Firstpage
444
Lastpage
450
Abstract
This paper summarizes key elements of the proposed IEEE P1149.4 Mixed-Signal Test Bus Standard, examines costs and benefits in detail, and includes specific circuit examples. The significant costs are silicon area and pins. Benefits include test cost reduction, diagnosability, and unique capabilities. Changes proposed since ITC´93 and areas of controversy are noted for this un-released standard
Keywords
IEEE standards; automatic test equipment; automatic testing; built-in self test; computer interfaces; costing; integrated circuit testing; mixed analogue-digital integrated circuits; peripheral interfaces; BIST; IEEE P1149.4 Mixed-Signal Test Bus Standard; analog bus pins; costs; data register; diagnosability; parametric measurements; silicon area; test cost reduction; Analog integrated circuits; Circuit testing; Costs; Digital integrated circuits; Integrated circuit testing; Pins; Signal design; Silicon; Telecommunications; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529871
Filename
529871
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