DocumentCode :
2056291
Title :
PECVD SiC as a Chemical Resistant Material in MEMS
Author :
Guo, Hui ; Wang, Yu ; Chen, Sheng ; Zhang, Guobing ; Zhang, Haixia ; Li, Zhihong
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing
fYear :
2006
fDate :
18-21 Jan. 2006
Firstpage :
805
Lastpage :
808
Abstract :
Silicon carbide (SiC) is a promising material for the device operating in hash environment, such as high temperature, high pressure or erodent environment, owning to its excellent electrical, mechanical, and chemical properties. The PECVD process allows deposition of SiC at low temperature (200degC-400degC), which makes SiC has better compatibility in Post-CMOS processes. In this paper, PECVD SiC has been investigated as a chemical resistant material in MEMS systematically. SiC was utilized as a coating layer to protect micromachined polysilicon devices from erosive environment and as a wet-etch mask to pattern silicon and glass. SiC was also used to construct microstructures taking the merit of SiC´s chemical stability.
Keywords :
CVD coatings; etching; masks; micromachining; micromechanical devices; protective coatings; silicon compounds; MEMS; PECVD; SiC; chemical resistant material; chemical stability; coating layer; erodent environment; hash environment; high pressure; high temperature; micromachined polysilicon devices protection; pattern glass; pattern silicon; post-CMOS processes; temperature 200 degC to 400 degC; wet-etch mask; Chemicals; Coatings; Glass; Mechanical factors; Micromechanical devices; Microstructure; Protection; Resistance; Silicon carbide; Temperature; Device protection; Etch mask; MEMS; PECVD; SiC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
Type :
conf
DOI :
10.1109/NEMS.2006.334900
Filename :
4135073
Link To Document :
بازگشت