DocumentCode :
2056324
Title :
Accelerated laboratory ageing of model insulator samples with semiconducting glazes
Author :
Ullrich, Heike ; Gubanski, Stanislaw M.
Author_Institution :
Chalmers Univ. of Technol., Gothenburg, Sweden
fYear :
2001
fDate :
2001
Firstpage :
274
Lastpage :
277
Abstract :
Semiconducting surfaces on outdoor insulators can improve performance under contaminated conditions. Numerous attempts have been undertaken to find suitable glaze compositions and today a range of reliable products is available. On the other hand, there are still concerns on the long-term stability of the semiconducting glazes and investigations aiming to find out the main ageing mechanisms, especially under DC voltage, are of great importance. In recent investigations, the authors found on insulator samples under natural field conditions, that similar surface changes took place under AC and DC voltage after several months of exposure. These changes were more severe for samples under DC stress. The aim of the investigations reported in this paper, was to model the ageing of samples with semiconducting glaze in the laboratory using the rotating-wheel-dip test. Besides the measurement of the voltage-current characteristics (I-V), dielectric spectroscopy was applied, in order to characterise the changes observed and to extend the knowledge concerning the conduction mechanism in the glaze before and after ageing
Keywords :
ageing; electric breakdown; electric current measurement; insulating coatings; insulator contamination; insulator testing; voltage measurement; I-V characteristics measurement; accelerated laboratory ageing; conduction mechanism; contaminated conditions; dielectric spectroscopy; insulating performance; long-term stability; model insulator samples; natural field conditions; outdoor insulators; rotating-wheel-dip test; semiconducting glazes; Accelerated aging; Glazes; Insulation; Laboratories; Semiconductivity; Semiconductor device testing; Stability; Stress; Surface contamination; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
Conference_Location :
Himeji
Print_ISBN :
4-88686-053-2
Type :
conf
DOI :
10.1109/ISEIM.2001.973645
Filename :
973645
Link To Document :
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