Title :
Testability-oriented hardware/software partitioning
Author :
Traon, Yves Le ; Hayek, Ghassan Al ; Robach, Chantal
Author_Institution :
LSR, IMAG, Grenoble, France
Abstract :
In this paper a test-based hardware/software partitioning approach is presented for a co-design specification. Depending on the hardware or software implementation choice for each unit-level component, the test cost for the whole system is evaluated. The unit test costs are estimated by means of mutation-based analysis with respect to the implementation choices
Keywords :
design for testability; economics; logic partitioning; logic testing; co-design specification; cost algorithm; hardware/software partitioning; mutation-based analysis; testability; unit test costs; Algorithm design and analysis; Application software; Costs; Embedded system; Hardware; Partitioning algorithms; Signal processing algorithms; Software testing; System testing; Time factors;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557131
