Title :
Evaluating waveform generation capabilities of VLSI test systems
Author :
Davis, Michael G.
Author_Institution :
LTX/Trillium, San Jose, CA, USA
Abstract :
This paper presents a means of evaluating the waveform generation capabilities of VLSI test systems. It presents a series of equations that can be used to determine the maximum frequency at which a timing system can produce a specific set of waveforms as a function of that timing system´s capabilities and restrictions
Keywords :
VLSI; automatic test equipment; integrated circuit testing; timing; waveform generators; ATE; VLSI test systems; format switching; marker generation system; maximum frequency; multiple clocks per period; retrigger time; strobing; timing system; waveform generation capabilities; Clocks; Frequency; Logic testing; Manufacturing; Optical signal processing; Pins; System testing; Test equipment; Timing; Very large scale integration;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529874
