DocumentCode
2056468
Title
Evaluating waveform generation capabilities of VLSI test systems
Author
Davis, Michael G.
Author_Institution
LTX/Trillium, San Jose, CA, USA
fYear
1995
fDate
21-25 Oct 1995
Firstpage
469
Lastpage
478
Abstract
This paper presents a means of evaluating the waveform generation capabilities of VLSI test systems. It presents a series of equations that can be used to determine the maximum frequency at which a timing system can produce a specific set of waveforms as a function of that timing system´s capabilities and restrictions
Keywords
VLSI; automatic test equipment; integrated circuit testing; timing; waveform generators; ATE; VLSI test systems; format switching; marker generation system; maximum frequency; multiple clocks per period; retrigger time; strobing; timing system; waveform generation capabilities; Clocks; Frequency; Logic testing; Manufacturing; Optical signal processing; Pins; System testing; Test equipment; Timing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529874
Filename
529874
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