DocumentCode :
2056529
Title :
Wafer level approaches for the integration of carbon nanotubes in electronic and sensor applications
Author :
Hermann, Sascha ; Fiedler, Holger ; Haibo, Yu ; Loschek, Sergei ; Bonitz, Jens ; Schulz, Stefan E. ; Gessner, Thomas
Author_Institution :
Center for Microtechnologies (ZfM), Chemnitz Univ. of Technol., Chemnitz, Germany
fYear :
2012
fDate :
20-23 March 2012
Firstpage :
1
Lastpage :
5
Abstract :
In this work we give an overview about recent developments in the integration technology of CNTs. We focus on wafer level approaches with the CVD and DEP method for growing as well as depositing CNTs in a defined way. So that we present methods to manipulate CNT growth structure, growth mode as well as growth inhibition in thermal CVD processes. This is highlighted by a unique growth structure opening new possibilities for CNT integration. Likewise, we show recent developments in scaling up the DEP method on wafer level. We round it up with the fabrication of CNT vias and MEMS structures containing CNT sensor elements.
Keywords :
carbon nanotubes; chemical vapour deposition; nanosensors; wafer level packaging; CVD method; DEP method; carbon nanotubes; electronic applications; integration technology; sensor applications; thermal CVD processes; wafer level approaches; Carbon; Carbon nanotubes; Dielectrophoresis; Electrodes; Films; Nickel; CNT; CVD; DEP; integration; interconnects; sensor; wafer level;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Signals and Devices (SSD), 2012 9th International Multi-Conference on
Conference_Location :
Chemnitz
Print_ISBN :
978-1-4673-1590-6
Electronic_ISBN :
978-1-4673-1589-0
Type :
conf
DOI :
10.1109/SSD.2012.6198090
Filename :
6198090
Link To Document :
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