DocumentCode
2056721
Title
Thickness dependence of rotatable anisotropy in exchange-biased NiFe/FeMn bilayers
Author
Kim, J.K. ; Kim, S.W. ; Kim, Byeong Koo ; Lee, S.S. ; Hwang, D.G.
Author_Institution
Dept. of Phys., Dankook Univ., Cheonan, South Korea
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
In this paper, we improved the AMR model to determinate the quantity and direction of rotatable anisotropy in the FeMn/NiFe with a thickness of AF and FM layers.
Keywords
antiferromagnetic materials; ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic hysteresis; magnetic thin films; manganese alloys; nickel alloys; NiFe-FeMn; exchange-biased NiFe/FeMn bilayers; rotatable anisotropy; Anisotropic magnetoresistance; Helium; Ion beams; Pins; Sputtering; Sun; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230886
Filename
1230886
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