Title :
Exchange bias in MnPd/Fe bilayers
Author :
Blomqvist, P. ; Krishnan, K.M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Washington Univ., Seattle, WA, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we present the MnPd/Fe exchange bias system. The growth as well as the magnetic properties of MnPd/Fe bilayers have been thoroughly investigated by means of X-ray diffraction (XRD), transmission electron microscopy (TEM), and vibrating sample magnetometry (VSM). MnPd/Fe /MgO bilayers with high crystalline quality have been deposited at different temperatures on MgO [001] substrates using the ion-beam sputtering technique. Hysteresis loops from two different bilayers, one sample deposited at 600 /spl deg/C and the other deposited at 800 /spl deg/C.
Keywords :
X-ray diffraction; antiferromagnetic materials; coercive force; ferromagnetic materials; ion beam effects; iron; magnesium compounds; magnetic anisotropy; magnetic hysteresis; magnetic thin films; manganese alloys; palladium alloys; sputter deposition; transmission electron microscopy; 600 degC; 800 degC; MgO [001] substrates; MnPd-Fe-MgO; MnPd/Fe bilayers; MnPd/Fe exchange bias system; TEM; X-ray diffraction; XRD; hysteresis loops; ion-beam sputtering; magnetic properties; transmission electron microscopy; vibrating sample magnetometry; Crystallization; Iron; Magnetic force microscopy; Magnetic hysteresis; Magnetic properties; Sputtering; Temperature; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230889
