• DocumentCode
    2056829
  • Title

    ASIC BIST synthesis: a VHDL approach

  • Author

    Eberle, Tom ; McVay, Bob ; Meyers, Chris ; Moore, Jason

  • Author_Institution
    DFT Technol. Group, Sanders Associates Inc., Nashua, NH, USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    741
  • Lastpage
    750
  • Abstract
    This paper describes the practical aspects of an automated design process and tool environment developed to rapidly and effectively include BIST into ASIC designs. An overview of the BIST architecture is given describing BIST capabilities for ASIC mission logic, embedded and external memory, devices, and an interconnect BIST capability used to assist module/PCB BIST. A high level synthesis approach is employed using the VHDL language in a way unique to its intended purpose. An automatic means for instantiating VHDL BIST structures into an ASIC design is described. Other automated phases of the development cycle are discussed including testability enhancement of the ASIC core and test stimulus generation for foundry, factory, and field test. Results are presented for 6 ASIC designs ranging in gate count from 56 k-164 k gates (complexity from controllers to data processors)
  • Keywords
    SRAM chips; application specific integrated circuits; automatic test equipment; automatic testing; built-in self test; design for testability; hardware description languages; high level synthesis; logic testing; production testing; 56 to 164 k; ASIC BIST synthesis; ASIC design; ASIC mission logic; BIST architecture; SRAM; VHDL language; automated design; controllers; data processors; embedded memory; external memory; factory testing; field test; foundry; high level synthesis; interconnect BIST; module/PCB BIST; test stimulus generation; Application specific integrated circuits; Automatic control; Automatic testing; Built-in self-test; Foundries; High level synthesis; LAN interconnection; Logic devices; Process design; Production facilities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557133
  • Filename
    557133