• DocumentCode
    2056945
  • Title

    Up to 9Gbit/s data transmission with monolithically integrated VCSELs and PIN photodiodes

  • Author

    Kern, Alexander ; Wahl, Dietmar ; Paul, Sujoy ; Haidar, Mohammad Tanvir ; Blood, Rainer ; Schwarz, Wolfgang ; Michalzik, Rainer

  • Author_Institution
    Inst. of Optoelectron., Ulm Univ., Ulm, Germany
  • fYear
    2011
  • fDate
    22-26 May 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Up to 9Gbit/s data transmission with monolithically integrated VCSELs and PIN photodiodes is reported. The complete layer structure of the monolithic transceiver chip is grown in one epitaxial run using molecular beam epitaxy on GaAs substrate. The layers of the PIN PD on top of the VCSEL structure are selectively removed by several wet and reactive-ion etching processes. The top-emitting, transverse multimode oxide-confined VCSEL is separated by a 2 to 4 μm wide trench from the PIN PD. The 3 μm thick anti-reflection coated PD shows responsivities of 0.61 A/W at 850 nm, which corresponds to a quantum efficiency of nearly 88%. Digital data transmission experiments were performed in back-to-back (BTB) mode in order to avoid dispersion effects of the glass fiber.
  • Keywords
    antireflection coatings; data communication equipment; integrated optoelectronics; laser beam applications; laser cavity resonators; molecular beam epitaxial growth; monolithic integrated circuits; optical films; optical transceivers; p-i-n photodiodes; semiconductor lasers; sputter etching; surface emitting lasers; GaAs; PIN photodiodes; antireflection coatings; data transmission; epitaxial layers; molecular beam epitaxy; monolithic transceiver chip; monolithically integrated VCSEL; reactive-ion etching; size 3 mum; transverse multimode oxide-confined VCSEL; wavelength 850 nm; wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
  • Conference_Location
    Munich
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0533-5
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/CLEOE.2011.5942550
  • Filename
    5942550