Title :
2008 26th international conference on microelectronics
Abstract :
The following topics are dealt: microelectronics; nanotechnologies; semiconductor device/circuit physics and modeling; opto and microwave devices and ICs; semiconductor processes and technologies; microsystem technologies; circuit design and testing; VLSI circuits; system design; circuit modeling and simulation; and device/circuit reliability physics.
Keywords :
MMIC; VLSI; circuit simulation; integrated circuit design; integrated circuit modelling; integrated circuit reliability; integrated circuit technology; integrated circuit testing; integrated optoelectronics; micromechanical devices; microwave transistors; nanoelectronics; optoelectronic devices; semiconductor device models; semiconductor device reliability; semiconductor device testing; semiconductor technology; VLSI circuits; circuit design; circuit simulation; circuit testing; microelectronics; microsystem technologies; microwave devices; nanotechnologies; opto devices; reliability physics; semiconductor device/circuit modeling; semiconductor processes; semiconductor technologies; system design;
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
DOI :
10.1109/ICMEL.2008.4559205
