• DocumentCode
    2057260
  • Title

    Affection of power system relay cooperation to voltage sag and sensitive equipment

  • Author

    Liu Yong ; Chen Lipin ; Yuan Zhijian

  • Author_Institution
    Deyang Electr. Power Bur., Deyang, China
  • fYear
    2012
  • fDate
    10-14 Sept. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    When the power system component faults, the voltage sag duration depends on the cooperation time of protection system. Many literatures have analyzed the influencing factors of voltage sag magnitude, such as fault types, fault location, pre-fault voltage, transformer connections, and fault impedance. But the affection of protection cooperation to sag duration is not considered in detailed. A probabilistic modeling of the cooperation of the protection system is proposed based on the concept of Markov state space to estimate the sag duration. After that, the voltage sag frequency and sensitive equipment trip probability are estimated by utilizing the configuration and setting value of the protection system. The proposed method was applied to the IEEE 57-bus test system, and the simulation results show that the proposed method is practical, simple and adaptive, and the study of this paper has both theoretical significance and engineering application value for voltage sag frequency assessment.
  • Keywords
    Markov processes; power supply quality; power system faults; power system protection; probability; relay protection; IEEE 57-bus test system; Markov state space; fault impedance; fault location; power system component faults; power system relay cooperation affection; prefault voltage; probabilistic modeling; protection system; sensitive equipment trip probability; transformer connections; voltage sag duration; voltage sag frequency assessment; voltage sag magnitude; Markov state space; protection configuration; protection cooperation; stochastic assessment; voltage sags;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electricity Distribution (CICED), 2012 China International Conference on
  • Conference_Location
    Shanghai
  • ISSN
    2161-7481
  • Print_ISBN
    978-1-4673-6065-4
  • Electronic_ISBN
    2161-7481
  • Type

    conf

  • DOI
    10.1109/CICED.2012.6508457
  • Filename
    6508457