Abstract :
Presents the table of contents of the proceedings.
Keywords :
CMOS technology; Circuit simulation; Nanoscale devices; Optical arrays; Optical noise; Plasma simulation; Semiconductor device modeling; Sensor arrays; Silicon carbide; Solid state circuits;
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
DOI :
10.1109/ICMEL.2008.4559210
