DocumentCode :
2057425
Title :
Silicon quantum dot devices
Author :
Oda, Shunri
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo
fYear :
2008
fDate :
11-14 May 2008
Firstpage :
31
Lastpage :
34
Abstract :
Quantum dot structures, where electrons are confined three-dimensionally in the below 10 nm scale, show characteristics quite different from conventional bulk structures. Recent progress in the fabrication technology of silicon nanostructures has made possible observations of novel electrical and optical properties of silicon quantum dots, such as single electron tunneling, ballistic transport, visible photoluminescence and electron emission. Electron transport and photonic properties of silicon nanocrystals prepared by plasma processes are described with particular emphasis on fabrication of monodispersed silicon nanocrystals, high-density assembly of silicon quantum dots, silicon nanodot memory, NEMS devices, and silicon photonic devices.
Keywords :
ballistic transport; electron emission; nanostructured materials; nanotechnology; optoelectronic devices; photoluminescence; semiconductor quantum dots; semiconductor storage; silicon; vacuum microelectronics; NEMS devices; Si; ballistic transport; conventional bulk structures; electrical properties; electron emission; electron transport; monodispersed silicon nanocrystals; optical properties; photonic properties; plasma processes; quantum dot structures; silicon nanodot memory; silicon nanostructure fabrication technology; silicon photonic devices; silicon quantum dot devices; single electron tunneling; visible photoluminescence; Electron emission; Electron optics; Nanocrystals; Nanostructures; Optical device fabrication; Plasma properties; Quantum dots; Silicon; Stimulated emission; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
Electronic_ISBN :
978-1-4244-1882-4
Type :
conf
DOI :
10.1109/ICMEL.2008.4559218
Filename :
4559218
Link To Document :
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