Title :
Electronic apparatus parameters prediction with adaptive clustering procedure
Author :
Shcherbakova, Galyna ; Krylov, Viktor
Author_Institution :
Odessa Polytech. Nat. Univ., Odessa, Ukraine
Abstract :
In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.
Keywords :
electronic products; parameter estimation; pattern clustering; production engineering computing; signal processing; electronic apparatus; noise immunity adaptive clustering; parameter prediction; Automatic testing; Clustering methods; Covariance matrix; Electronic equipment testing; Extrapolation; Iterative methods; Multidimensional systems; Optimization methods; Production; Wavelet domain; Adaptive clustering; noise immunity; parameters prediction; sub-gradient; wavelet transformation;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
Conference_Location :
Lviv-Slavske
Print_ISBN :
978-966-553-875-2
Electronic_ISBN :
978-966-553-901-8
