DocumentCode :
2057603
Title :
Design of a Resonant Miniature Electrostatic Field Sensor with Feedback Driving and Detection
Author :
Peng, C.R. ; Chen, X.X. ; Ye, C. ; Bai, Q. ; Xia, S.H.
Author_Institution :
State Key Lab. of Transducer Technol. Inst. of Electron., Chinese Acad. of Sci., Beijing
fYear :
2006
fDate :
18-21 Jan. 2006
Firstpage :
1029
Lastpage :
1032
Abstract :
The paper presents a new design of resonant miniature electrostatic field sensors (EFS) based on surface micromachining process. With a phase and an amplitude closed loop feedback control, the sensor can be adjusted automatically to operate at its resonant frequency in despite of the temperature influence. For minimizing the capacitive feedthrough, a feedback detecting loop is utilized in the design. The digital concept of the new electronics for EFS aims to eliminate the additional noise and especially temperature drift yielded by analog components. Based on a digital lock-in amplifier, the main function of the designed electronics has been realized. We achieve a lower nonlinearity of 1.8% (end-point-straight-line) at resonant frequency (4.13 kHz) in measurement the range of (0~10kV/m for our primary EFS
Keywords :
amplifiers; closed loop systems; electric field measurement; electric sensing devices; electromagnetic shielding; micromachining; microsensors; 4.13 kHz; EFS; closed loop feedback control; detection; digital lock-in amplifier; electrostatic fieldmeter; feedback detecting loop; feedback driving; fieldmill; noise elimination; resonant frequency; resonant miniature electrostatic field sensor design; shielding electrode; surface micromachining; temperature drift; Capacitance; Electric fields; Electrodes; Electrostatics; Feedback loop; Micromachining; Micromechanical devices; Resonance; Resonant frequency; Temperature sensors; Electrostatic field sensor; Electrostatic fieldmeter; Feedback control; Fieldmill; Resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
Type :
conf
DOI :
10.1109/NEMS.2006.334605
Filename :
4135122
Link To Document :
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