DocumentCode :
2057683
Title :
Smart traveling wave fault location system based on electronic transformer
Author :
Yihua Dong ; Tongjing Sun ; Bingyin Xu
Author_Institution :
Shandong Univ., Jinan, China
fYear :
2012
fDate :
10-14 Sept. 2012
Firstpage :
1
Lastpage :
6
Abstract :
The existing electronic transformer sampling frequency to meet the functional requirements of the measurement, protection, its sampling frequency is lower than 12.8K. Traveling wave fault location device required signal bandwidth of the M-Class. The required signal bandwidth should reach 500K even with the Line traps affect, which affected its promotion and application of digital substation. The authors proposed shunt sampling method to collect data in electronic transformer acquisition side and in part of the merging unit deal with common signal and traveling wave signal program. The program is both to meet the needs of the general device of the general signal, but also to meet the needs of the traveling wave fault location device on the traveling wave signal of the transient high-speed sampling. Smart traveling wave fault location device directly receive the IEC61850 standard format of digital signal processing fault location Algorithm to reduce the analog-digital conversion and processing sectors, ranging efficiency.
Keywords :
fault location; power transformer protection; sampling methods; signal processing; substation automation; substation protection; IEC61850 standard; M-class signal bandwidth; analog-digital conversion; digital signal processing fault location algorithm; digital substation; electronic transformer acquisition side; electronic transformer sampling frequency; line traps affect; shunt sampling method; smart traveling wave fault location system; transient high-speed sampling; traveling wave fault location device; traveling wave signal program; Electronic transformer; IEC 61850; sampling frequency; traveling wave signal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electricity Distribution (CICED), 2012 China International Conference on
Conference_Location :
Shanghai
ISSN :
2161-7481
Print_ISBN :
978-1-4673-6065-4
Electronic_ISBN :
2161-7481
Type :
conf
DOI :
10.1109/CICED.2012.6508473
Filename :
6508473
Link To Document :
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