DocumentCode :
2057705
Title :
Dynamic Performance of Micro Coordinate Measurement Probe
Author :
Shih, Po-Jen ; Shih, Wen-Pen ; Lin, Tzung-Han ; Huang, Han-Pang
Author_Institution :
Dept. of Mech. Eng., Nat. Taiwan Univ., Taipei
fYear :
2006
fDate :
18-21 Jan. 2006
Firstpage :
1047
Lastpage :
1051
Abstract :
A three-dimensional microprobe, which is capable of measuring the forces exerting on the probing pin in all directions, is presented. The microprobe is fabricated on stainless steel and is covered by two sets of piezoelectric transducers. One of the transducers drives the probe, and the other senses the dynamic response to identify the contact between the pin and obstacles. A theoretical model is carried out to investigate the transition of the microprobe between contact and non-contact states. Accordingly, a bifurcation diagram is established to provide a design reference for the optimization of driving frequency. A finite element simulation is also carried out for the complete design optimization. Indeed, the fabricated microprobe can be used for the coordinate measurement of the high-aspect-ratio micro-structures
Keywords :
bifurcation; coordinate measuring machines; dynamic response; finite element analysis; force measurement; mechanical contact; micromechanics; piezoelectric transducers; probes; stainless steel; vibrations; 3D microprobe; bifurcation diagram; contact identification; design optimization; driving frequency; dynamic performance; dynamic response sensor; finite element simulation; force measurement; microcoordinate measurement probe; microprobe transition; microstructures; piezoelectric transducers; probing pin; stainless steel; theoretical model; vibration; Bifurcation; Boundary conditions; Coordinate measuring machines; Design optimization; Frequency; Moon; Piezoelectric transducers; Probes; Surface topography; Vibration measurement; bifurcaton; contact; microprobe; vibration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
Type :
conf
DOI :
10.1109/NEMS.2006.334609
Filename :
4135126
Link To Document :
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