Title :
Effects of multi-product, small-sized production of LSIs packaged in various packages on the final test process efficiency and cost
Author :
Fujioka, Hiromu ; Nakamae, Koji ; Higashi, Akio
Author_Institution :
Fac. of Eng., Osaka Univ., Japan
Abstract :
Effects of multi-product, small-sized production of LSIs packaged in various packages on the final test process efficiency and cost are evaluated through an event-driven simulation analysis which includes detailed parametric models
Keywords :
circuit analysis computing; computer testing; data structures; digital simulation; economics; integrated circuit manufacture; integrated circuit testing; large scale integration; LSI; cost; event-driven simulation analysis; final test process efficiency; multi-product small-sized production; one chip microcomputer; parametric models; simulation; Costs; Discrete event simulation; Large scale integration; Mass production; Microcomputers; Packaging; Parametric statistics; Production systems; Testing; Very large scale integration;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557139
