Title :
Dynamics of semiconductor lasers with polarization rotated feedback and its applications for fast random bit generation
Author :
Oliver, N. ; Soriano, M.C. ; Sukow, D. ; Fischer, I.
Author_Institution :
Inst. de Fis. Interdisciplinar y Sist. Complejos (IFISC), Univ. de les Illes Balears, Palma de Mallorca, Spain
Abstract :
Semiconductor lasers are nowadays most prominently used in telecommunications and data communications due to their small dimensions and cost-efficiency. One application of current interest is random bit sequence generation using chaotic semiconductor laser dynamics. Chaotic semiconductor lasers are attractive for this, since they allow for high bit rates in the GBit/s range. At the same time, as analog systems with noise, they avoid the shortcomings of digital systems, representing real random bit sequence generators, rather than pseudo-random bit sequence generators. Most of the recent studies are based on lasers subjected to coherent optical feedback, and require extensive signal processing using logic functions or high-order derivatives to achieve high generation rates. This paper proposes a new experimental scheme of random bit sequence generation based on semiconductor laser dynamics induced by polarization rotated feedback, where the interaction between the TE and TM-mode intensities through the carrier density generates chaotic instabilities. This method relies on rapid decorrelation of the high-frequency chaotic laser dynamics, and thus can produce fast random bits with minimal post-processing.
Keywords :
laser feedback; light polarisation; optical chaos; random sequences; semiconductor lasers; carrier density; chaotic instabilities; chaotic semiconductor laser dynamics; data communications; fast random bit generation; high frequency chaotic laser dynamics decorrelation; polarization rotated feedback; random bit sequence generation; telecommunications;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5942601