DocumentCode
2058334
Title
Estimation of reliability indices for symmetric ramified systems
Author
Sydor, Andriy
Author_Institution
Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2010
fDate
23-27 Feb. 2010
Firstpage
107
Lastpage
107
Abstract
Main reliability indices for unrestorable symmetric systems ramified to level 3 and with ageing output elements are examined in this paper. Models for the failure probability, the failure frequency and the failure rate are worked out in the case when the lifetime of ageing output elements is circumscribed by the Weibull distribution.
Keywords
Weibull distribution; ageing; computational complexity; exponential distribution; quality control; reliability; Weibull distribution; ageing output elements; failure frequency; failure probability; failure rate; reliability index estimation; symmetric ramified systems; Aging; Design automation; Exponential distribution; Frequency; Microelectronics; Quality control; Reliability theory; Sensor phenomena and characterization; Telecommunication computing; Weibull distribution; ageing elements; ramified systems; reliability indices; symmetric systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
Conference_Location
Lviv-Slavske
Print_ISBN
978-966-553-875-2
Electronic_ISBN
978-966-553-901-8
Type
conf
Filename
5446209
Link To Document