Title :
Estimation of reliability indices for symmetric ramified systems
Author_Institution :
Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
Main reliability indices for unrestorable symmetric systems ramified to level 3 and with ageing output elements are examined in this paper. Models for the failure probability, the failure frequency and the failure rate are worked out in the case when the lifetime of ageing output elements is circumscribed by the Weibull distribution.
Keywords :
Weibull distribution; ageing; computational complexity; exponential distribution; quality control; reliability; Weibull distribution; ageing output elements; failure frequency; failure probability; failure rate; reliability index estimation; symmetric ramified systems; Aging; Design automation; Exponential distribution; Frequency; Microelectronics; Quality control; Reliability theory; Sensor phenomena and characterization; Telecommunication computing; Weibull distribution; ageing elements; ramified systems; reliability indices; symmetric systems;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
Conference_Location :
Lviv-Slavske
Print_ISBN :
978-966-553-875-2
Electronic_ISBN :
978-966-553-901-8
