Title :
Near-field resonant sensors for scanning microwave microscopy
Author :
Gordienko, Yury ; Larkin, Serguei
Author_Institution :
Kharkov Nat. Univ. of Radio Electron., Kharkov, Ukraine
Abstract :
The results of numerical investigation into the most widely used versions of near-field resonant sensors for the SMM are generalized and the main concepts of their theory are formed in the report.
Keywords :
cavity resonators; electrodynamics; microwave detectors; near-field scanning optical microscopy; optical sensors; SMM; coaxial microprobe; electrodynamic analysis; near-field cavity sensors; near-field resonant sensors; radiation losses; scanning microwave microscopy; Apertures; Atomic force microscopy; Electrodynamics; Microwave sensors; Microwave theory and techniques; Nanoelectronics; Resonance; Sensor phenomena and characterization; Spatial resolution; Superconducting materials; Microwave microscopy; Resolution; Resonant sensor; Sensitivity;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
Conference_Location :
Lviv-Slavske
Print_ISBN :
978-966-553-875-2
Electronic_ISBN :
978-966-553-901-8
