Title :
Algorithmic extraction of BSDL from 1149.1-compliant sample ICs
Author :
Raymond, Douglas W. ; Wedge, D. ; Stringer, Philip J. ; Ng, Harold W. ; Jennings, Suzanne T. ; Pynn, Craig T. ; Soule, Winsor, Jr.
Author_Institution :
Assembly Test Group, Teradyne Inc., USA
Abstract :
BSDL files are essential for boundary-scan testing. However, they are hard to obtain, and frequently incorrect. We describe a tool which automatically extracts a basic BSDL file from a sample IC
Keywords :
automatic testing; boundary scan testing; design for testability; hardware description languages; integrated circuit design; integrated circuit testing; 1149.1-compliant sample ICs; ATPG; BSDL; IC design; algorithmic extraction; boundary scan description language; boundary-scan testing; scannable ICs; Assembly; Automatic test pattern generation; Automatic testing; Computer architecture; Fixtures; Integrated circuit testing; Machinery; Manufacturing; Software testing; Writing;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529884
