Subatomic Imaging of Si (001) Surface by Molecular Dynamic Simulation

Author

Liang, Yingchun ; Dou, Jianhua ; Bai, Qingshun ; Wang, Shumei ; Chen, Mingjun ; Zhao, Yan ; Dong, Shen

Author_Institution

Center for Precision Eng., Harbin Inst. of Technol.

fYear

2006

fDate

18-21 Jan. 2006

Firstpage

1156

Lastpage

1159

Abstract

In this study we predict the frequency modulation atomic force microscopy (FM-AFM) subatomic frequency shift images of a Si (001) surface using empirical potential molecular dynamic methods. We model carbon single-wall nanotube caped tip and Si (001) surface to investigate the tip-surface interaction. The simulation shows that the FM-AFM imaging force mainly comes from C-Si/C-C chemical covalent bonding forces; the long range nonbond van der Waals forces are slight and can be ignored

Keywords

atomic force microscopy; carbon nanotubes; molecular dynamics method; silicon; surface structure; C; FM-AFM subatomic frequency shift images; SWNT capped tip; Si; carbon single-wall nanotube capped tip; carbon-carbon chemical covalent bonding forces; carbon-silicon chemical covalent bonding forces; empirical potential molecular dynamic methods; frequency modulation atomic force microscopy; long range nonbond van der Waals forces; molecular dynamics simulation; silicon surface subatomic imaging; tip-surface interaction; Atomic force microscopy; Atomic layer deposition; Carbon nanotubes; Chemicals; Frequency modulation; Image resolution; Silicon; Slabs; Surface reconstruction; Systems engineering and theory; carbon nanotube; imaging; molecular dynamic simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on

Conference_Location

Zhuhai

Print_ISBN

1-4244-0139-9

Electronic_ISBN

1-4244-0140-2

Type

conf

DOI

10.1109/NEMS.2006.334670

Filename

4135152