DocumentCode :
2058552
Title :
A note on solar cell diagnostics using LBIC and LBIV methods
Author :
Salinger, Jan ; Benda, Vitezslav ; Machacek, Zdenek
Author_Institution :
Dept. Electr. Technol., Czech Tech. Univ. in Prague, Prague
fYear :
2008
fDate :
11-14 May 2008
Firstpage :
217
Lastpage :
220
Abstract :
LBIC and LBIV methods are widely used for diagnosing solar cell homogeneity. This paper deals with the possibility of conducting LBIC measurements on the LBIV measuring device. These two methods are compared theoretically, and also by looking at the maps of the examined solar cells. Attention is paid to the working point of the LBIC method, which applies not only for modified LBIV devices but for all measurements of short circuit current.
Keywords :
OBIC; solar cells; LBIC; LBIV; solar cell diagnostics; Current measurement; Electrical resistance measurement; Equations; Integrated circuit measurements; Laser beams; Photovoltaic cells; Position measurement; Short circuit currents; Voltage measurement; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
Electronic_ISBN :
978-1-4244-1882-4
Type :
conf
DOI :
10.1109/ICMEL.2008.4559262
Filename :
4559262
Link To Document :
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