Title :
Ultra-small physical random number generators based on Si nanodevices for security systems and comparison to other large physical random number generators
Author :
Yasuda, Shin-ichi ; Uchida, Ken ; Tanamoto, Tetsufumi ; Ohba, Ryuji ; Fujita, Shinobu
Author_Institution :
Adv. LSI Technol. Lab., Toshiba Corp., Kawasaki, Japan
Abstract :
We propose a new application of silicon (Si) nanodevices for mobile communication security systems, one of the most important elements of information technology (IT). We introduce Si nanodevices having nanoscaled electron channels and electron traps that can generate high-quality random numbers for cryptographic security. This is an example of the fruitful fusion of nanotechnology (NT) and IT.
Keywords :
CMOS logic circuits; cryptography; electron traps; elemental semiconductors; mobile communication; nanotechnology; random number generation; silicon; single electron transistors; CMOS logic circuits; IT; Si; Si nanodevices; cryptographic security; electron traps; high quality random numbers; information technology; mobile communication security systems; nanoscaled electron channels; nanotechnology; physical random number generators; single electron transistors; Communication system security; Cryptography; Electron traps; Fusion power generation; Information security; Information technology; Mobile communication; Nanotechnology; Random number generation; Silicon;
Conference_Titel :
Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Print_ISBN :
0-7803-7976-4
DOI :
10.1109/NANO.2003.1230964
