DocumentCode :
2058653
Title :
Amplification of space charge waves of short wave part of millimeter wave range in n-GaN films
Author :
Grimalsky, V. ; Koshevaya, S. ; Diaz-A, F. ; Escobedo-A, J.
Author_Institution :
Autonomous Univ. of Morelos (UAEM), Cuernavaca
fYear :
2008
fDate :
11-14 May 2008
Firstpage :
233
Lastpage :
236
Abstract :
An amplification of space charge waves (SCW) due to the negative differential conductivity in n-GaN films placed onto a semi-infinite substrate is considered and possible spatial increments are calculated. Both diffusion-drift equations for volume electron concentration and also an approximation of two-dimensional electron gas were used jointly with the Poisson equation for the electric field. When compared with a case of the n-GaAs film, it is possible to observe an amplification of SCW in n-GaN films of submicron thicknesses at essentially higher frequencies f ges 100 GHz. It is possible to obtain high (~10 kV/cm) output electric fields of the short wave part of the millimeter wave range. Direct numerical simulations of nonlinear equations of motion confirm the results of calculations of spatial increments in the film of a finite thickness.
Keywords :
III-V semiconductors; Poisson equation; diffusion; electrical conductivity; electron density; gallium compounds; nonlinear equations; semiconductor thin films; space charge waves; two-dimensional electron gas; wide band gap semiconductors; GaN; Poisson equation; diffusion-drift equation; frequency 100 GHz; n-GaN film; negative differential conductivity; nonlinear equations; space charge wave amplification; two-dimensional electron gas; volume electron concentration; Conductive films; Conductivity; Dielectric substrates; Electron mobility; Frequency; Gallium arsenide; Gallium nitride; Microelectronics; Poisson equations; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
Electronic_ISBN :
978-1-4244-1882-4
Type :
conf
DOI :
10.1109/ICMEL.2008.4559266
Filename :
4559266
Link To Document :
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