• DocumentCode
    2059110
  • Title

    Hierarchical functional fault simulation for high-level synthesis

  • Author

    Kassab, M. ; Rajski, J. ; Tyszer, J.

  • Author_Institution
    MACS Lab., McGill Univ., Montreal, Que., Canada
  • fYear
    1995
  • fDate
    21-25 Oct 1995
  • Firstpage
    596
  • Lastpage
    605
  • Abstract
    A novel highly efficient fault simulation technique targeted for circuits produced through high-level synthesis is presented. The technique combines hierarchical and functional fault simulation of commonly used building blocks that have regular structures. Comparison with gate-level simulation demonstrates the advantage of using this technique for this class of circuits
  • Keywords
    built-in self test; circuit analysis computing; digital simulation; high level synthesis; minimisation of switching nets; benchmark circuits; hierarchical functional fault simulation; high-level synthesis; logic simulation; regular structures; Arithmetic; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Computational modeling; High level synthesis; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1995. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2992-9
  • Type

    conf

  • DOI
    10.1109/TEST.1995.529888
  • Filename
    529888