DocumentCode :
2059170
Title :
Diamond Thin Film Micro-package for MEMS Resonator
Author :
Zhu, Xiangwei ; Aslam, Dean M. ; Sepúlveda, Nelson ; Sullivan, J.P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
fYear :
2006
fDate :
18-21 Jan. 2006
Firstpage :
1280
Lastpage :
1283
Abstract :
This paper reports the development of a polycrystalline diamond (poly-C) thin film encapsulation packaging process which is integrated into the MEMS cantilever resonator fabrication. The high Young´s modulus and chemical stability of poly-C make it an excellent candidate material for a thin film package. A test chip is fabricated using a 4-mask process. First, poly-C cantilever beam resonator is fabricated using a 2-mask process, while PECVD SiO2 serves as sacrificial layer material. Then, another sacrificial PECVD SiO2 layer with a thickness in the range of 4-5 mum is deposited at 350 degC and is patterned to create package anchor. A 4-mum-thick poly-C film is grown and patterned to provide fluidic access ports for the releasing of the package. Then, the fluidic access ports are sealed with an additional poly-C growth. To evaluate the efficacy of the poly-C encapsulation process, poly-C cantilever beam resonators were tested using piezoelectric actuation and laser detection method before and after poly-C packaging process. Resonance frequencies measured before and after are in the range of 240-320 KHz, which is consistent with theoretical calculations. The application of diamond for thin film packaging is being reported for the first time
Keywords :
CVD coatings; Young´s modulus; cantilevers; diamond; encapsulation; micromechanical resonators; packaging; thin films; 240 to 320 kHz; 350 C; 4 to 5 micron; C; MEMS resonator; PECVD technique; SiO2; Young´s modulus; cantilever beam; chemical stability; encapsulation; laser detection; micro-package; piezoelectric actuation; poly-C thin film; polycrystalline diamond thin film; Chemicals; Encapsulation; Fabrication; Micromechanical devices; Packaging; Piezoelectric films; Stability; Structural beams; Testing; Transistors; MEMS; diamond; package; resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
Type :
conf
DOI :
10.1109/NEMS.2006.334715
Filename :
4135179
Link To Document :
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