DocumentCode :
2059196
Title :
RTD-based smart temperature sensor: Process development and circuit design
Author :
Santos, Edval J P ; Vasconcelos, Isabela B.
Author_Institution :
Electron. & Syst. Dept., Univ. Fed. de Pernambuco, Recife
fYear :
2008
fDate :
11-14 May 2008
Firstpage :
333
Lastpage :
336
Abstract :
Planar resistance temperature detector, RTD, can be manufactured with microelectronics processing techniques. However, the manufactured planar resistor requires an extra step for adjustment of the 0degC reference resistance, R 0. In this paper, we have evaluated the fabrication of nickel-RTD transducers for smart temperature sensors. By applying the smart sensor concept, the resistance adjustment step is avoided, as the calibration curve can be stored in the Transducer Electronics Datasheet (TEDS). The RTDs have been fabricated by thermal evaporation of nickel onto an alumina substrate. Calibration curves have been measured as a function of temperature, and a high linearity is observed. Two different prototypes for the conditioning and processing electronics are analyzed.
Keywords :
calibration; integrated circuit design; intelligent sensors; temperature sensors; RTD-based smart temperature sensor; Transducer Electronics Datasheet; calibration curve; circuit design; microelectronics processing techniques; planar resistance temperature detector; process development; Calibration; Circuit synthesis; Detectors; Fabrication; Intelligent sensors; Manufacturing processes; Microelectronics; Resistors; Temperature sensors; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
Electronic_ISBN :
978-1-4244-1882-4
Type :
conf
DOI :
10.1109/ICMEL.2008.4559289
Filename :
4559289
Link To Document :
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