DocumentCode :
2059208
Title :
Monolithic High-Aspect-Ratio Embedded Parylene Channel Technology: Fabrication, Integration, and Applications
Author :
Chen, Po-Jui ; Tai, Yu-Chong
Author_Institution :
Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA
fYear :
2006
fDate :
18-21 Jan. 2006
Firstpage :
1284
Lastpage :
1287
Abstract :
This paper presents a novel channel fabrication technology of monolithic bulk-micromachined embedded channels. Based upon implementing two-step complementary dry etching technique and conformal parylene C layer deposition, high-aspect-ratio (internal channel height/internal channel width, greater than 20) polymer channels with uniform quasi-rectangular sidewalls have been successfully fabricated in one silicon wafer. The fabrication is completely compatible with further lithographic CMOS/MEMS process, which enables its total integration with on-chip micro sensors/actuators/structures for lab-on-a-chip applications. An exemplary process has been successfully demonstrated to verify the possibility of combining bulk micromachining and surface micromachining. This proposed formation of channels can be extensively used as beam elements in micromechanical devices or microcolumns for high-performance/high-throughput chip-based separation analysis. A spiral parylene column longer than 1.1 m embedded in a 3.3 mm times 3.3 mm chip has been presented as a prospective element in micro gas-chromatography (muGC)
Keywords :
lab-on-a-chip; micromachining; micromechanical devices; monolithic integrated circuits; CMOS; MEMS; aspect-ratio; dry etching; embedded channels; lab-on-a-chip applications; layer deposition; lithography; micro gas-chromatography; microactuators; micromachining; micromechanical devices; microsensors; parylene; Actuators; CMOS process; Dry etching; Fabrication; Lab-on-a-chip; Micromachining; Micromechanical devices; Polymers; Silicon; Spirals; embedded channel; high-aspect-ratio; monolithic; parylene;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
Type :
conf
DOI :
10.1109/NEMS.2006.334716
Filename :
4135180
Link To Document :
بازگشت