DocumentCode :
2059228
Title :
Event driven mixed signal modeling techniques for System-in-Package functional verification
Author :
Webber, Chip ; Holmes, Jim ; Francis, Matt ; Berger, Richard ; Mantooth, Alan ; Arthurs, Aaron ; Cornett, Kim ; Cressler, John D.
Author_Institution :
Lynguent, Inc., Fayetteville, AR, USA
fYear :
2010
fDate :
6-13 March 2010
Firstpage :
1
Lastpage :
16
Abstract :
Developing complex mixed-signal System-in-Package (SiP) chip-sets or Systems-on-Chip (SoC) typically involves parallel analog and digital IC development, where verification engineers can expect to encounter disconnects between the design automation flows, user proficiencies, and IC release cycles. Verifying the SiP chip-set prior to manufacturing is the key milestone where these disconnects are resolved. Presented is a unique modeling, simulation and verification method which bridges these gaps much earlier in the design process. As an illustrative example the verification of a complex SiP for space applications is presented.
Keywords :
integrated circuit design; integrated circuit modelling; mixed analogue-digital integrated circuits; system-in-package; system-on-chip; SiP; design process; event driven mixed signal modeling; functional verification; space applications; system-in-package; systems-on-chip; USA Councils; Virtual reality;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2010 IEEE
Conference_Location :
Big Sky, MT
ISSN :
1095-323X
Print_ISBN :
978-1-4244-3887-7
Electronic_ISBN :
1095-323X
Type :
conf
DOI :
10.1109/AERO.2010.5446659
Filename :
5446659
Link To Document :
بازگشت