DocumentCode
2059399
Title
Scalable mean voter for fault-tolerant mixed-signal circuits
Author
Askari, Syed ; Dwivedi, Badri ; Saeed, Adnan ; Nourani, Mehrdad
Author_Institution
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
fYear
2010
fDate
6-13 March 2010
Firstpage
1
Lastpage
10
Abstract
Redundancy techniques, such as N-tuple modular redundancy has been widely used to improve the reliability of digital circuits. Unfortunately nothing substantial has been done for the analog and mixed signal systems. In this paper, we propose a redundancy based fault-tolerant methodology to design a highly reliable analog and digital circuits and systems. The key contribution of our work is an innovative mean voter. This mean voter is a low power, small area, very high bandwidth and linearly scalable voting circuit. Unlike other conventional voters which works with odd N in an NMR, the mean voter works for both odd and even N for analog units and hence reduces the area and power further. For the proof of concept, we designed two fault tolerant analog circuits i.e. a low pass anti-aliasing analog filter and a 4-bit flash ADC. We also presented fault-tolerance mechanism in 4-bit binary adder and an FPGA cell for demonstrating its advantage in digital applications. Experimental results are reported to verify the concepts and measure the system´s reliability when single upset transient may occur.
Keywords
adders; analogue-digital conversion; fault tolerant computing; field programmable gate arrays; integrated circuit reliability; low-pass filters; mixed analogue-digital integrated circuits; redundancy; FPGA cell; N-tuple modular redundancy; analog and digital circuits; analog and mixed signal systems; binary adder; digital circuit reliability; fault tolerant analog circuits; fault-tolerance mechanism; fault-tolerant methodology; fault-tolerant mixed-signal circuits; flash ADC; innovative mean voter; low pass anti-aliasing analog filter; redundancy techniques; scalable mean voter; system reliability; voting circuit; Analog circuits; Bandwidth; Design methodology; Digital circuits; Fault tolerance; Fault tolerant systems; Nuclear magnetic resonance; Power system reliability; Redundancy; Voting;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2010 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4244-3887-7
Electronic_ISBN
1095-323X
Type
conf
DOI
10.1109/AERO.2010.5446666
Filename
5446666
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