DocumentCode
2059622
Title
Character of non-stoichiometric InP bulk crystal
Author
Mao, Luhong ; Sun, Niefeng ; Zhou, Xiaolong ; Wu, Xiawan ; Guo, Weilian ; Hu, Ming ; Li, Lingxia ; Xiao, Mi ; Fu, Jiande ; Yao, Zhihong ; Zhao, Yanjun ; Yang, Kewu ; Sun, Tongnian
Author_Institution
Sch. of Electron. Inf. Eng., Tianjin Univ., China
fYear
2004
fDate
20-25 Sept. 2004
Firstpage
19
Lastpage
22
Abstract
P-rich, In-rich and stoichiometric undoped InP melts have been synthesized by phosphorus in-situ injection method, InP crystal ingots have been grown from these melts by LEC method. The difference in these InP crystal should be attributed to the change of stoichiometry. Some samples from these ingots have been characterized by the Hall effect and Fourier transform infrared (FT-IR) spectroscopy measurements respectively. The Hall effect measurement results indicate that the carrier concentration of P-rich undoped InP is higher than that of In-rich and stoichiometric undoped InP materials. The intensive absorption peaks indicate that our phosphorus in-situ injection synthesis LEC undoped InP materials have relatively high concentration of hydrogen related complexes. The FT-IR results are also in agreement with the carrier concentration of InP grown from different stoichiometric melts.
Keywords
Fourier transform spectra; Hall effect; III-V semiconductors; carrier density; crystal growth from melt; indium compounds; infrared spectra; ingots; semiconductor growth; stoichiometry; FTIR; Fourier transform infrared spectroscopy; Hall effect; InP; LEC; carrier concentration; ingots; nonstoichiometric InP bulk crystal; phosphorus in-situ injection method; undoped melts; Application specific integrated circuits; Containers; Crystalline materials; Crystals; Electromagnetic wave absorption; Fourier transforms; Hall effect; Indium phosphide; Infrared spectra; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconducting and Insulating Materials, 2004. SIMC-XIII-2004. 13th International Conference on
Print_ISBN
0-7803-8668-X
Type
conf
DOI
10.1109/SIM.2005.1511376
Filename
1511376
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