Title :
In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices
Author :
Huang, Tony Jun ; Flood, Amar ; Chu, Chih-Wei ; Kang, Seogshin ; Guo, Tzung-Fang ; Yamamoto, Tohru ; Tseng, Hsian-Rong ; Yu, Bi-Dan ; Yang, Yang ; Stoddart, J. Fraser ; Ho, Chih-Ming
Author_Institution :
Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
Abstract :
An in situ Fourier-transform infrared (FTIR) spectroscopic technique has been developed to monitor molecular behavior in single-molecule thick nanoelectronic devices. This approach is applicable to a range of molecular-based devices and has the potential to provide researchers in the field with a tool to understand the molecular behavior that contributes to device performance.
Keywords :
Fourier transforms; infrared spectra; nanoelectronics; Fourier transform infrared spectra; molecular behavior; single molecule thick nanoelectronic devices; Aerospace engineering; Biochemistry; CMOS technology; Design optimization; Infrared spectra; Materials science and technology; Molecular electronics; Monitoring; Nanoscale devices; Spectroscopy;
Conference_Titel :
Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Print_ISBN :
0-7803-7976-4
DOI :
10.1109/NANO.2003.1231008
