Title :
Formal verification of the UltraSPARC(TM) family of techniques
Author_Institution :
Sun Microele., Mountain View, CA, USA
Abstract :
This paper describes a novel and important use of a commercial Automatic Test Pattern Generation (ATPG) tool to perform formal verification during the design of the UltraSPARC(TM)-I and UltraSPARC(TM)-II microprocessors. The verification problem addressed in this paper is that of required signal constraints amongst a group of signals to ensure correct multiplexor operation. We do not address the equivalence between two representations of a design which is the more common problem in literature. The technique developed was a significant contributor to the overall success of the project. The problem addressed, solution formulation, software developed, and results are presented
Keywords :
computer testing; design for testability; formal verification; integrated circuit testing; multiplexing; multiplexing equipment; ATPG; Automatic Test Pattern Generation; UltraSPARC; binary decision diagrams; design rules; equivalence; formal verification; microprocessors; multiplexed design; multiplexor operation; rule violations; signal constraints; Automatic test pattern generation; Decoding; Design automation; Formal verification; Libraries; Logic design; Microelectronics; Microprocessors; Signal design; Sun;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557146