Title :
Crest-factor analysis of carrier interferometry MC-CDMA and OFDM systems
Author :
Wunder, Gerhard ; Paterson, Kenneth G.
Author_Institution :
Fraunhofer German-Sino Lab., Mobile Commun. MCI, Berlin, Germany
fDate :
27 June-2 July 2004
Abstract :
This paper describes the crest-factor analysis of carrier interferometry MC-CDMA and OFDM systems. The maximum crest factor of CF signals grows as log(N). Thus there appears to be an impressive reduction in the crest factor of CI signals. The crest factor performance for carrier interferometry systems is the same as in standard systems, in the sense that the statistical distributions of CF are identical. Hence, the carrier interferometry approach has no CF gain in the asymptotic regime. This analysis is advantageous in terms of BER and diversity.
Keywords :
OFDM modulation; code division multiple access; error statistics; interferometry; statistical distributions; BER; MC-CDMA; OFDM system; carrier interferometry; crest-factor analysis; multicarrier code division multiple access; orthogonal frequency division multiplexing; standard system; statistical distribution; Bit error rate; Fast Fourier transforms; Information security; Interferometry; Mobile communication; Multicarrier code division multiple access; OFDM; Peak to average power ratio; Probability; System performance;
Conference_Titel :
Information Theory, 2004. ISIT 2004. Proceedings. International Symposium on
Print_ISBN :
0-7803-8280-3
DOI :
10.1109/ISIT.2004.1365463
