• DocumentCode
    2059873
  • Title

    Elastic Modulus Investigation of Gallium Nitride Nanotubes

  • Author

    Hung, ShangChao ; Su, YanKuin ; Fang, TeHua ; Liang, TsairChun

  • Author_Institution
    Inst. of Microelectron., Nat. Cheng Kung Univ., Tainan
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    1400
  • Lastpage
    1403
  • Abstract
    In this study, we analyzed gallium nitride nanotubes which were formed highly oriented on a c-axis perpendicular to substrate surface by using nanoindentation technique. We were focusing experimental observations on the nanomechanical properties. The behavior of the gallium nitride nanotube breakage accompanying with compression test was examined using a nanoindentation system enabling the application of compressive force to the nanotubes homogeneously. The buckling energy of compression for a single gallium nitride nanotube had been measured. The corresponding value of elastic modulus of gallium nitride nanotube was also characterized. With comparing to thin film nanoindentation experiment, the elastic modulus of gallium nitride nanotubes in this experiment was shift from that in bulk-crystal of gallium nitride
  • Keywords
    III-V semiconductors; buckling; elastic moduli; fracture; gallium compounds; indentation; semiconductor nanotubes; wide band gap semiconductors; GaN; breakage; buckling energy; compression; compressive force; elastic modulus; gallium nitride nanotubes; nanoindentation technique; nanomechanical property; Etching; Gallium nitride; III-V semiconductor materials; Mechanical factors; Nanostructures; Nanotubes; Optical films; Stimulated emission; Substrates; System testing; Elastic Modulus; SEM; gallium nitride; nanoindentation; nanotube;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334775
  • Filename
    4135205