DocumentCode :
2059885
Title :
Linearity evaluation technique for CMOS differential amplifier
Author :
Popa, C.
Author_Institution :
Telecommun. & Inf. Technol., Univ. Politeh. of Bucharest, Bucharest
fYear :
2008
fDate :
11-14 May 2008
Firstpage :
451
Lastpage :
454
Abstract :
A very important block in VLSI CMOS analog design, the classical differential amplifier presents the disadvantage of the nonlinearity of the transfer characteristic, especially for large values of the differential input voltage amplitude, this undesired behavior being concretized in large distortions introduced by the circuit. The proposed approach of the CMOS differential amplifier solves in an intuitive manner the quantitative and quantitative evaluation of the circuit nonlinearity by using an expansion in Taylor series of the amplifier transfer function. Additionally, a very simple and efficient linearization technique will be proposed, based on the compensation of the quadratic characteristic of the MOS transistor biased in saturation by using complementary current-mode square-root circuits. SPICE simulations and Fourier analysis confirm the theoretical estimated results, contributing to a deep understand of the classical differential amplifier behavior and of the operation of linearization technique.
Keywords :
Fourier analysis; MOSFET; VLSI; differential amplifiers; transfer functions; CMOS differential amplifier; Fourier analysis; MOS transistor; SPICE simulations; Taylor series; VLSI CMOS analog design; amplifier transfer function; circuit nonlinearity; current-mode square-root circuits; differential input voltage amplitude; linearity evaluation technique; linearization technique; quantitative-quantitative evaluation; CMOS analog integrated circuits; CMOS technology; Differential amplifiers; Linearity; Linearization techniques; MOSFETs; Taylor series; Transfer functions; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
Electronic_ISBN :
978-1-4244-1882-4
Type :
conf
DOI :
10.1109/ICMEL.2008.4559319
Filename :
4559319
Link To Document :
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