DocumentCode
2059926
Title
Tuning Semiconducting Properties of Single Carbon Nanotube for Fabrication of Nano Devices
Author
Chan, Ho-Yin ; Xi, Ning ; Zhang, Jiangbo ; Li, Guangyong
Author_Institution
Robotics & Autom. Lab., Michigan State Univ., East Lansing, MI
fYear
2006
fDate
18-21 Jan. 2006
Firstpage
1410
Lastpage
1413
Abstract
Carbon nanotube (CNT) is found to be an amazing material for nanoelectronics due to its unique properties. It provides the possibility of miniaturizing the traditional electronic elements. Recently, people have been focusing on exploring its applications on optoelectronics because CNT is a direct bandgap material and its bandgap is inversely related to its diameter. Thus, it is ease for photon adsorption or generation with different wavelengths. In this paper, we presented the modification of the diameter of a single multi-walled carbon nanotube (s-MWNT) by electrical breakdown of nanotube walls. Thus, the conduction mechanism of the single carbon nanotube (s-CNT) can change from conducting to semi-conducting. Also, the barrier height of the s-CNT based diode which is fabricated by using atomic force microscopy based nanomanipulation system, can be indirectly modified, which has the same effect from CNT doping. The breakdown of a MWNT was investigated using atomic force microscopy (AFM) and the diameter, changed from 60 nm to ~10 nm, was measured at each step of breakdowns. Using this modification technique, the s-CNT based diode can potentially be used in optoelectronics
Keywords
atomic force microscopy; carbon nanotubes; electric breakdown; elemental semiconductors; nanoelectronics; nanotube devices; optoelectronic devices; semiconductor diodes; C; CNT doping; atomic force microscopy; barrier height; electrical breakdown; nanodevices fabrication; nanoelectronics; nanomanipulation system; nanotube walls; optoelectronics; s-CNT based diode; semiconducting property; single multi-walled carbon nanotube; Atomic force microscopy; Atomic measurements; Carbon nanotubes; Electric breakdown; Force measurement; Optical device fabrication; Organic materials; Photonic band gap; Semiconductivity; Semiconductor diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location
Zhuhai
Print_ISBN
1-4244-0139-9
Electronic_ISBN
1-4244-0140-2
Type
conf
DOI
10.1109/NEMS.2006.334777
Filename
4135207
Link To Document