• DocumentCode
    2059926
  • Title

    Tuning Semiconducting Properties of Single Carbon Nanotube for Fabrication of Nano Devices

  • Author

    Chan, Ho-Yin ; Xi, Ning ; Zhang, Jiangbo ; Li, Guangyong

  • Author_Institution
    Robotics & Autom. Lab., Michigan State Univ., East Lansing, MI
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    1410
  • Lastpage
    1413
  • Abstract
    Carbon nanotube (CNT) is found to be an amazing material for nanoelectronics due to its unique properties. It provides the possibility of miniaturizing the traditional electronic elements. Recently, people have been focusing on exploring its applications on optoelectronics because CNT is a direct bandgap material and its bandgap is inversely related to its diameter. Thus, it is ease for photon adsorption or generation with different wavelengths. In this paper, we presented the modification of the diameter of a single multi-walled carbon nanotube (s-MWNT) by electrical breakdown of nanotube walls. Thus, the conduction mechanism of the single carbon nanotube (s-CNT) can change from conducting to semi-conducting. Also, the barrier height of the s-CNT based diode which is fabricated by using atomic force microscopy based nanomanipulation system, can be indirectly modified, which has the same effect from CNT doping. The breakdown of a MWNT was investigated using atomic force microscopy (AFM) and the diameter, changed from 60 nm to ~10 nm, was measured at each step of breakdowns. Using this modification technique, the s-CNT based diode can potentially be used in optoelectronics
  • Keywords
    atomic force microscopy; carbon nanotubes; electric breakdown; elemental semiconductors; nanoelectronics; nanotube devices; optoelectronic devices; semiconductor diodes; C; CNT doping; atomic force microscopy; barrier height; electrical breakdown; nanodevices fabrication; nanoelectronics; nanomanipulation system; nanotube walls; optoelectronics; s-CNT based diode; semiconducting property; single multi-walled carbon nanotube; Atomic force microscopy; Atomic measurements; Carbon nanotubes; Electric breakdown; Force measurement; Optical device fabrication; Organic materials; Photonic band gap; Semiconductivity; Semiconductor diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334777
  • Filename
    4135207