Title :
Plug & play IDDQ monitoring with QTAG
Author :
Baker, K. ; Waayers, T.F. ; Bouwman, F.G.M. ; Verstraelen, M.J.W.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
This paper describes the development of a language based on VHDL intended to simplify the use of IDDQ/ISSQ instrumentation in production IC testing. This language, called “Monitor Description Format” or MDF, is part of the development by QTAG (Quality Test Action Group) of an infrastructure for IDDQ/ISSQ testing. Using MDF developers and vendors of current monitors for test fixtures and test systems can define the functionality of the instrumentation. Using MDF the front-end tools to convert a test sequence to control the monitor can be automatically generated from the CAD test data for the DUT. In addition,for the test programs a standard library for control of monitors can be developed which would be driven from MDF. Ultimately MDF can be used with commercial supported QTAG monitors and ATE based measurement subsystems to create a “Plug and Play” environment for IDDQ/ ISSQ testing
Keywords :
VLSI; automatic test equipment; automatic testing; integrated circuit testing; production testing; ATE based measurement subsystems; IDDQ/ISSQ instrumentation; MDF; Monitor Description Format; QTAG; plug and play environment; production IC testing; standard library; test fixtures; test sequence; Automatic generation control; Automatic testing; Fixtures; Instruments; Integrated circuit testing; Libraries; Plugs; Production; Standards development; System testing;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529905
